Local polarization and valence distribution in LaNiO3/LaMnO3 heterostructures
arXiv:2104.12322 · doi:10.1103/PhysRevB.104.085111
Abstract
The inside of the electrical double layer at perovskite oxide heterointerfaces is examined. Here, we report the local polarization and valence distribution in LaNiO/LaMnO and LaMnO/LaNiO bilayers on a SrTiO (001) substrate. Simultaneous measurements of two aspects of the structure are realized by using Bayesian inference based on resonant- and nonresonant-surface X-ray diffraction data. The results show that the average Mn valences are Mn and Mn for the two samples. The intensity of their local electric field is 1~GV/m and the direction of the field points from LaMnO to LaNiO.
19pages, 4 figures
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