About two-dimensional fits for the analysis of the scattering rates and renormalization functions from angle-resolved photoelectron spectroscopy data
arXiv:2104.10545 · doi:10.1016/j.elspec.2021.147127
Abstract
A new method for the analysis of the scattering rates from angle-resolved photoelectron spectroscopy (ARPES) is presented and described in details. It takes into account experimental instrumental resolution and finite temperature effects. More accurate results are obtained in comparison with a standard, commonly used method. The application of the method is demonstrated for several examples commonly encountered in new quantum materials. Its usefulness is especially apparent in investigations of systems with strongly correlated electrons.
12 pages, 6 figures
References in corpus (5)
- Self-consistent self-energy analysis of photoemission data
- Bare electron dispersion from photoemission experiments
- Deep learning-based statistical noise reduction for multidimensional spectral data
- Extracting the spectral function of the cuprates by a full two-dimensional analysis: Angle-resolved photoemission spectra of Bi2Sr2CuO6
- Unveiling quasiparticle dynamics of topological insulators through Bayesian modelling