Coherent energy exchange between carriers and phonons in Peierls-distorted bismuth unveiled by broadband XUV pulses
arXiv:2103.03137 · doi:10.1103/PhysRevResearch.3.033210
Abstract
In Peierls-distorted materials, photoexcitation leads to a strongly coupled transient response between structural and electronic degrees of freedom, always measured independently of each other. Here we use transient reflectivity in the extreme ultraviolet to quantify both responses in photoexcited bismuth in a single measurement. With the help of first-principles calculations based on density-functional theory (DFT) and time-dependent DFT, the real-space atomic motion and the temperature of both electrons and holes as a function of time are captured simultaneously, retrieving an anticorrelation between the phonon dynamics and carrier temperature. The results reveal a coherent, bi-directional energy exchange between carriers and phonons, which is a dynamical counterpart of the static Peierls-Jones distortion, providing first-time validation of previous theoretical predictions.
References in corpus (12)
- Advanced capabilities for materials modelling with Quantum ESPRESSO
- Quantum ESPRESSO toward the exascale
- Thermal Contraction and Disordering of the Al(110) Surface
- Direct and Simultaneous Observation of Ultrafast Electron and Hole Dynamics in Germanium
- Electronic phase transitions of bismuth under strain from relativistic self-consistent GW calculations
- Coherent Phonon Coupling to Individual Bloch States in Photoexcited Bismuth
- Attosecond time-domain measurement of core-excitonic decay in magnesium oxide
- Entropy driven atomic motion in laser-excited bismuth
- Hot Phonon and Carrier Relaxation in Si(100) Determined by Transient Extreme Ultraviolet Spectroscopy
- Coherent modulation of the electron temperature and electron-phonon couplings in a 2D material
- Electron Thermalization and Relaxation in Laser-Heated Nickel by Few-Femtosecond Core-Level Transient Absorption Spectroscopy
- Source noise suppression in attosecond transient absorption spectroscopy by edge-pixel referencing