Tuning the mode-splitting of a semiconductor microcavity with uniaxial stress
arXiv:2102.09327 · doi:10.1103/PhysRevApplied.15.054061
Abstract
A splitting of the fundamental optical modes in micro/nano-cavities comprising semiconductor heterostructures is commonly observed. Given that this splitting plays an important role for the light-matter interaction and hence quantum technology applications, a method for controlling the mode-splitting is important. In this work we use an open microcavity composed of a "bottom" semiconductor distributed Bragg reflector (DBR) incorporating an n-i-p heterostructure, paired with a "top" curved dielectric DBR. We measure the mode-splitting as a function of wavelength across the stopband. We demonstrate a reversible in-situ technique to tune the mode-splitting by applying uniaxial stress to the semiconductor DBR. The method exploits the photoelastic effect of the semiconductor materials. We achieve a maximum tuning of 11 GHz. The stress applied to the heterostructure is determined by observing the photoluminescence of quantum dots embedded in the sample, converting a spectral shift to a stress via deformation potentials. A thorough study of the mode-splitting and its tuning across the stop-band leads to a quantitative understanding of the mechanism behind the results.
7 pages, 5 figures
References in corpus (6)
- Chiral Quantum Optics
- A solid-state entangled photon pair source with high brightness and indistinguishability
- A small mode volume tunable microcavity: development and characterization
- Large-Range Frequency Tuning of a Narrow-Linewidth Quantum Emitter
- Suppression of surface-related loss in a gated semiconductor microcavity
- Opto-Mechanical Tuning of the Polarization Properties of Micropillar Cavity Systems with embedded Quantum Dots