Semiconductors and Dirichlet-to-Neumann maps

Abstract

We investigate the problem of identifying discontinuous doping profiles in semiconductor devices from data obtained by the stationary voltage-current (VC) map. The related inverse problem correspond to the inverse problem for the Dirichlet-to-Neumann (DN) map with partial data.

13 pages, 2 figures

References in corpus (2)

• On inverse problems for semiconductor equations
• On inverse doping profile problems for the stationary voltage-current map

Cited by in corpus (1)

• On projective Landweber-Kaczmarz methods for solving systems of nonlinear ill-posed equations