Transverse beam emittance measurement by undulator radiation power noise
arXiv:2012.00832 · doi:10.1103/PhysRevLett.126.134802
Abstract
Generally, turn-to-turn power fluctuations of incoherent spontaneous synchrotron radiation in a storage ring depend on the 6D phase-space distribution of the electron bunch. In some cases, if only one parameter of the distribution is unknown, this parameter can be determined from the measured magnitude of these power fluctuations. In this Letter, we report an absolute measurement (no free parameters or calibration) of a small vertical emittance (5--15 nm rms) of a flat beam by this method, under conditions, when it is unresolvable by a conventional synchrotron light beam size monitor.
arXiv admin note: substantial text overlap with arXiv:2012.00965. substantial text overlap with arXiv:2012.00965
References in corpus (2)
Cited by in corpus (4)
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