Trends in the valence band electronic structures of mixed uranium oxides

Abstract

Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and by computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to proof the validity of theoretical approximations

arXiv commentChem Commun (2018)

References in corpus (5)

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Cited by in corpus (3)

• High-resolution valence band RIXS at the actinide M${}_{4,5}$-edges
• Getting the manifold right: The crucial role of orbital resolution in DFT+U for mixed d-f electron compounds
• Modeling of Nuclear Waste Forms: State-of-the-Art and Perspectives