In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting
arXiv:2009.05083 · doi:10.1126/sciadv.abe8311
Abstract
Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.
References in corpus (2)
Cited by in corpus (5)
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- Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy
- Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy