Response to comment on "Resolving spatial and energetic distributions of trap states in metal halide perovskite solar cells"

Abstract

Ravishankar et al. claimed the drive-level capacitance profiling (DLCP) method cannot resolve trap density along depth direction in perovskites with given thickness, and explained the measured charges to be a consequence of geometrical capacitance and diffusion capacitance. We point out that the trap densities in DLCP method are derived from the differential capacitance at different frequencies, and thus the background charges caused by diffusion and geometry capacitance has been subtracted. Even for the non-differential doping analysis by DLCP, the contribution from diffusion capacitance is shown to be negligible and contribution from geometry capacitance is excluded. Additional experiment results further support the measured trap density represents the actual trap distribution in perovskite solar cells.

arXiv comment12 pages, 6 figures

References in corpus (3)

• Self-regulation mechanism for charged point defects in hybrid halide perovskites
• Dynamic Shortening of Disorder Potentials in Anharmonic Halide Perovskites
• Deep Levels and Mixed Conductivity in Organometallic Halide Perovskites

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• Topological-defect-induced surface charge heterogeneities in nematic electrolytes
• Physics-based material parameters extraction from perovskite experiments via Bayesian optimization
• Modulation of Point Defect Properties Near Surfaces in Metal Halide Perovskites
• Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect