Study of charging up effect in a triple GEM detector

Abstract

The advancement of Micro Pattern Gaseous Detector technology offers us different kinds of detectors with good spatial resolution and high rate capability and the Gas Electron Multiplier (GEM) detector is one of them. Typically GEM is made up of a thin polyimide foil having a thickness of 50 micrometers with 5 micrometers copper cladding on top and bottom sides. The presence of polyimide changes the gain of the detector under the influence of external radiation and the phenomenon is referred to as the charging up effect. The charging up effect is investigated with a double mask triple GEM detector prototype with Ar/CO${}_2$ gas mixture in 70/30 ratio under continuous irradiation from a strong Fe${}^{55}$ X-ray source. The detailed method of measurements and the test results are presented in this article.

References in corpus (5)

• A Time Projection Chamber for High-Rate Experiments: Towards an Upgrade of the ALICE TPC
• A dynamic method for charging-up calculations: the case of GEM
• Study of uniformity of characteristics over the surface for triple GEM detector
• Measurements of the Charging-Up Effect in Gas Electron Multipliers
• Measurement of spark probability of GEM detector for CBM muon chamber (MUCH)

Cited by in corpus (5)

• Study of charging-up effect for a single mask triple GEM detector
• Effect of relative humidity on the long-term operation of a single mask triple GEM chamber
• Observation on the bias current variation of a single mask triple GEM chamber
• Double-GEM based thermal neutron detector prototype
• A Novel Manufacturing Process for Glass THGEMs and First Characterisation in an Optical Gaseous Argon TPC