Beyond coincidence: using all the data in Hong-Ou-Mandel interferometry
arXiv:2005.14696 · doi:10.1103/PhysRevA.102.033714
Abstract
The Hong-Ou-Mandel effect provides a mechanism to determine the distinguishability of a photon pair by measuring the bunching rates of two photons interfering at a beam splitter. Of particular interest is the distinguishability in time, which can be used to probe a time delay. Photon detectors themselves give some timing information, however--while that resolution may dwarf that of an interferometric technique--typical analyses reduce the interference to a binary event, neglecting temporal information in the detector. By modelling detectors with number and temporal resolution we demonstrate a greater precision than coincidence rates or temporal data alone afford. Moreover, the additional information can allow simultaneous estimation of a time delay alongside calibration parameters, opening up the possibility of calibration-free protocols and approaching the precision of the quantum Cramér-Rao bound.
20 pages, 11 figures
References in corpus (12)
- Quantum metrology from a quantum information science perspective
- An avalanche-photodiode-based photon-number-resolving detector
- Optimal phase measurements with pure Gaussian states
- Resolving photon numbers using a superconducting tapered nanowire detector
- Quantum state estimation with nuisance parameters
- Quantum-enhanced stimulated emission microscopy
- Hong-Ou-Mandel interference between independent III-V on silicon waveguide integrated lasers
- Tracking the polarisation state of light via Hong-Ou-Mandel interferometry
- Quantum sensors for dynamical tracking of chemical processes
- A single-photon detector with high efficiency and sub-10ps time resolution
- Design of High-Performance Photon Number Resolving Photodetectors Based on Coherently Interacting Nanoscale Elements
- Quantum correlations overcome the photodamage limits of light microscopy
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- Interferometric signature of different spectral symmetries of biphoton states
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- Engineering of Hong-Ou-Mandel interference with effective noise
- Semiparametric estimation in Hong-Ou-Mandel interferometry