X-ray optics and beam characterisation using random modulation: Experiments

Abstract

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

13 pages, 13 figures. arXiv admin note: substantial text overlap with arXiv:1902.09418

References in corpus (2)

• Wavefront-sensing with a thin diffuser
• Near-field speckle-scanning-based x-ray imaging

Cited by in corpus (5)

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• Directional dark-field implicit x-ray speckle tracking using an anisotropic-diffusion Fokker-Planck equation