X-ray optics and beam characterisation using random modulation: Experiments
arXiv:1912.05432 · doi:10.1107/S1600577520000508
Abstract
In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.
13 pages, 13 figures. arXiv admin note: substantial text overlap with arXiv:1902.09418