Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap

Abstract

Recent studies indicated that contamination by adatoms on the surface ion trap can generate contact potential, leading to fluctuations in patch potential. By investigating contamination induced by surface adatoms during a loading process, a direct physical image of the contamination process and the relationship between the capacitance change and the contamination from surface adatoms is examined theoretically and experimentally. From the relationship, the contamination by surface adatoms and the effect of in situ treatment process can be monitored by the capacitance between electrodes in real time. This study is foundational to further research on anomalous heating with practical applications in quantum information processing from surface ion traps.

arXiv comment8 pages, 5 figures

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