Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance
arXiv:1903.12610 · doi:10.1103/PhysRevAccelBeams.22.082801
Abstract
Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.
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- Ultrafast Relativistic Electron Nanoprobes
- Transverse phase space tomography in the CLARA accelerator test facility using image compression and machine learning
- Transverse phase space characterisation in the CLARA FE accelerator test facility at Daresbury Laboratory
- Relativistic ultrafast electron diffraction at high repetition rates
- Characterizing ultra-low emittance electron beams using structured light fields
- Ultrafast Electron Diffraction: Visualizing Dynamic States of Matter
- All-optical source size and emittance measurements of laser-accelerated electron beams