Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature
arXiv:1901.11400
Abstract
Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.
3 page paper submission for Optical Society of America meeting on Optical Interference Coatings