X-ray diffraction analysis to support phase identification in FeSe and Fe${}_7$Se${}_8$ epitaxial thin films

Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain $\beta$-FeSe and Fe${}_7$Se${}_8$ phases in a double epitaxy configuration with the $\beta$-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe${}_7$Se${}_8$ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the $\beta$-FeSe phase are shown.