Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields
arXiv:1812.01740 · doi:10.1063/1.5084104
Abstract
The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under sub-coercive and above-coercive fields using time-resolved X-ray diffraction. During the application of an external field to the pre-poled thin film capacitor, structural signatures of domain nucleation and growth include broadening of the in-plane peak width of a Bragg reflection concomitant with a decrease of the peak intensity. This disordered domain state is remanent and can be erased with an appropriate voltage pulse sequence.
References in corpus (10)
- Physics of thin-film ferroelectric oxides
- A tetragonal-to-monoclinic phase transition in a ferroelectric perovskite: the structure of PbZr(0.52)Ti(0.48)O3
- Domain wall creep in epitaxial ferroelectric Pb(Zr0.2Ti0.8)O3 thin films
- Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single crystalline films
- Domain wall roughness in epitaxial ferroelectric PbZr0.2Ti0.8O3 thin films
- xrayutilities: A versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors
- Observation of inhomogeneous domain nucleation in epitaxial Pb(Zr,Ti)O3 capacitors
- Crystallography under external electric field
- Subcoercive and multilevel ferroelastic remnant states with resistive readout
- Simultaneous dynamic characterization of charge and structural motion during ferroelectric switching