Unveiling the outstanding oxygen mass transport properties of Mn-rich perovskites in grain boundary-dominated La0.8Sr0.2(Mn1-xCox)0.85O3-d nanostructures
arXiv:1811.12729 · doi:10.1021/acs.chemmater.8b01771
Abstract
Ion transport in solid-state devices is of great interest for current and future energy and information technologies. A superior enhancement of several orders of magnitude of the oxygen diffusivity has been recently reported for grain boundaries in lanthanum strontium manganites. However, the significance and extent of this unique phenomenon is not yet established. Here, we fabricate a thin film continuous composition map of the La0.8Sr0.2(Mn1-xCox)0.85O3-d family revealing a substantial enhancement of the grain boundary oxygen mass transport properties for the entire range of compositions. Through isotope-exchange depth profiling coupled to secondary ion mass spectroscopy, we show that this excellent performance is not directly linked to the bulk of the material but to the intrinsic nature of the grain boundary. In particular, the great increase of the oxygen diffusion in Mn-rich compositions unveils an unprecedented catalytic performance in the field of Mixed Ionic Electronic Conductors. These results present grain boundaries engineering as a novel strategy for designing highly performing materials for solid state ionics based devices.
References in corpus (3)
- Recent advances in pulsed-laser deposition of complex-oxides
- A continuous compositional-spread technique based on pulsed-laser deposition and applied to the growth of epitaxial films
- Insights into the enhancement of oxygen mass transport properties of strontium doped lanthanum manganite interface-dominated thin films
Cited by in corpus (4)
- Engineering Transport in Manganites by Tuning Local Non-Stoichiometry in Grain Boundaries
- Engineering mass transport properties in oxide ionic and mixed ionic electronic thin film ceramic conductors for energy applications
- Unraveling Bulk and Grain Boundary Electrical Properties in La0.8Sr0.2Mn1-yO3 Thin Films
- A collapsed interface approach to resolve grain boundaries in finite element simulations of polycrystalline diffusion