Fourier Domain Rotational Anisotropy Second Harmonic Generation

Abstract

We describe a novel scheme of detecting rotational anisotropy second harmonic generation (RA-SHG) signals using a lock-in amplifier referenced to a fast scanning RA-SHG apparatus. The method directly measures the $n^{th}$ harmonics of the scanning frequency corresponding to SHG signal components of $C_n$ symmetry that appear in a Fourier series expansion of a general RA-SHG signal. GaAs was used as a test sample allowing comparison of point-by-point averaging with the lock-in based method. When divided by the $C_{\infty }$ signal component, the lock-in detected data allowed for both self-referenced determination of ratios of $C_n$ components of up to 1 part in 10${}^4$ and significantly more sensitive measurement of the relative amount of different $C_n$ components when compared with conventional methods.