3D-Printed Optics for Wafer-Scale Probing
arXiv:1808.10834
Abstract
Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integration platforms.
Accepted for presentation at European Conference on Optical Communications (ECOC) 2018