Antiferromagnetic MnNi tips for spin-polarized scanning probe microscopy
arXiv:1807.00364 · doi:10.1063/1.5042530
Abstract
Spin-polarized scanning tunneling microscopy (SP-STM) measures tunnel magnetoresistance (TMR) with atomic resolution. While various methods for achieving SP probes have been developed, each is limited with respect to fabrication, performance, and allowed operating conditions. In this study, we present the fabrication and use of SP-STM tips made from commercially available antiferromagnetic foil. The tips are intrinsically SP, which is attractive for exploring magnetic phenomena in the zero field limit. The tip material is relatively ductile and straightforward to etch. We benchmark the conventional STM and spectroscopic performance of our tips and demonstrate their spin sensitivity by measuring the two-state switching of holmium single atom magnets on MgO/Ag(100).
References in corpus (13)
- Topological Insulators
- Topological Order and the Quantum Spin Hall Effect
- Signatures of Majorana fermions in hybrid superconductor-semiconductor nanowire devices
- Advances in the Physics of Magnetic Skyrmions and Perspective for Technology
- Observation of Majorana Fermions in Ferromagnetic Atomic Chains on a Superconductor
- Reading and Writing Single-Atom Magnets
- Topological Phases in Graphene Nanoribbons: Junction States, Spin Centers and Quantum Spin Chains
- Visualizing the spin of individual molecules
- Engineering the eigenstates of coupled spin-1/2 atoms on a surface
- Thermal and magnetic field stability of holmium single atom magnets
- Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy
- Adsorption Sites of Individual Metal Atoms on Ultrathin MgO(100) Films
- Etching of Cr tips for scanning tunneling microscopy of cleavable oxides