Interface thermal behavior in nanomaterials by thermal grating relaxation
arXiv:1805.12086
Abstract
We study the relaxation of a thermal grating in multilayer materials with interface thermal resistances. The analytical development allows for the nu- merical determination of this thermal property in Approach to Equilibrium Molecular Dynamics and suggests an experimental setup for its measurement. Possible non-diffusive effects at the nanoscale are take into consideration by a non-local formulation of the heat equation. As a case study, we numerically apply the present approach to silicon grain boundary thermal resistance
References in corpus (4)
- Direct Measurement of Room Temperature Non-diffusive Thermal Transport Over Micron Distances in a Silicon Membrane
- A novel high resolution contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry
- Interfacial thermal conductance in graphene/black phosphorus heterogeneous structures
- Length dependence of thermal conductivity by approach-to-equilibrium molecular dynamics