THz nanofocusing with cantilevered THz-resonant antenna tips
arXiv:1805.01150 · doi:10.1021/acs.nanolett.7b01924
Abstract
We developed THz-resonant scanning probe tips, yielding strongly enhanced and nanoscale confined THz near fields at their tip apex. The tips with length in the order of the THz wavelength (λ = 96.5 μm) were fabricated by focused ion beam (FIB) machining and attached to standard atomic force microscopy (AFM) cantilevers. Measurements of the near-field intensity at the very tip apex (25 nm radius) as a function of tip length, via graphene-based (thermoelectric) near-field detection, indicate their first and second order geometrical antenna resonances for tip length of 33 and 78 μm, respectively. On resonance, we find that the near-field intensity is enhanced by one order of magnitude compared to tips of 17 μm length (standard AFM tip length), which is corroborated by numerical simulations that further predict remarkable intensity enhancements of about 107 relative to the incident field. Because of the strong field enhancement and standard AFM operation of our tips, we envision manifold and straightforward future application in scattering-type THz near-field nanoscopy and THz photocurrent nanoimaging, nanoscale nonlinear THz imaging, or nanoscale control and manipulation of matter employing ultrastrong and ultrashort THz pulses.
This document is the Accepted Manuscript version of a Published Work that appeared in Nano Letters. Copyright American Chemical Society after peer review and technical editing by the publisher. To access the final published work see: https://pubs.acs.org/doi/abs/10.1021/acs.nanolett.7b01924 The authors acknowledge support from the European Commission under theGrapheneCore1, grant no. 696656
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