Cross-calibration of GaAs deformation potentials and gradient-elastic tensors using photoluminescence and nuclear magnetic resonance spectroscopy in GaAs/AlGaAs quantum dot structures
arXiv:1804.06879 · doi:10.1103/PhysRevB.97.235311
Abstract
Lattice matched GaAs/AlGaAs epitaxial structures with quantum dots are studied under static uniaxial stress applied either along the or crystal directions. We conduct simultaneous measurements of the spectral shifts in the photoluminescence of the bulk GaAs substrate, which relate to strain via deformation potentials and , and the quadrupolar shifts in the optically detected nuclear magnetic resonance spectra of the quantum dots, which relate to the same strain via the gradient-elastic tensor . Measurements in two uniaxial stress configurations are used to derive the ratio in good agreement with previous studies on GaAs. Based on the previously estimated value of eV we derive the product of the nuclear quadrupolar moment and the -tensor diagonal component in GaAs to be V for As and V for Ga nuclei. In our experiments the signs of are directly measurable, which was not possible in the earlier nuclear acoustic resonance studies. Our values are a factor of 1.4 smaller than those derived from the nuclear acoustic resonance experiments [Phys. Rev. B 10, 4244 (1974)]. The gradient-elastic tensor values measured in this work can be applied in structural analysis of strained III-V semiconductor nanostructures via accurate modelling of their magnetic resonance spectra.
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