Shot noise limited nanomechanical detection and radiation pressure backaction from an electron beam
arXiv:1803.09312 · doi:10.1103/PhysRevLett.122.083603
Abstract
Detecting nanomechanical motion has become an important challenge in Science and Technology. Recently, electromechanical coupling to focused electron beams has emerged as a promising method adapted to ultra-low scale systems. However the fundamental measurement processes associated with such complex interaction remain to be explored. Here we report highly sensitive detection of the Brownian motion of um-long semiconducting nanowires (InAs). The measurement imprecision is found to be set by the shot noise of the secondary electrons generated along the electromechanical interaction. By carefully analysing the nano-electromechanical dynamics, we demonstrate the existence of a radial backaction process which we identify as originating from the momentum exchange between the electron beam and the nanomechanical device, which is also known as radiation pressure.
References in corpus (12)
- A Mechanical Mass Sensor with Yoctogram Resolution
- Radiation-pressure cooling and optomechanical instability of a micro-mirror
- A single NV defect coupled to a nanomechanical oscillator
- Strain-mediated coupling in a quantum dot-mechanical oscillator hybrid system
- Dissipative Optomechanics in a Michelson--Sagnac Interferometer
- Universal Vectorial and Ultrasensitive Nanomechanical Force Field Sensor
- Vectorial scanning force microscopy using a nanowire sensor
- Bidimensional nano-optomechanics and topological backaction in a non-conservative radiation force field
- Observation of back-action cancellation in interferometric and weak force measurements
- Stabilization of a linear nanomechanical oscillator to its ultimate thermodynamic limit
- Real-time measurement of nanotube resonator fluctuations in an electron microscope
- Dynamical Backaction Cooling with Free Electrons