Uncertainties in permittivities computed from molecular dynamics simulations and temperature correction of dielectric properties of condensed polar systems

Abstract

A robust, simple and fast procedure for the calculation of uncertainties in relative static dielectric permittivity (${\epsilon }_s$) computed via molecular dynamics (MD) is proposed. It arises as a direct application of well founded statistical methods for auto-correlated variables. Also, in order to deal with the lack of experimental data about ${\epsilon }_s$ and relaxation times ($\tau$) at different temperatures, a method for their prediction is suggested. It requires one experimental value and at least two MD simulations. In the case of relaxation times, a theoretical justification is provided.

10 pages, 5 figures and 2 tables