Optical weak measurements without removing the Goos-Haenchen phase

Abstract

Optical weak measurements are a powerful tool for measuring small shifts of optical paths. When applied to the measurement of the Goos-Haenchen shift, in particular, a special step must be added to its protocol: the removal of the relative Goos-Haenchen phase, since its presence generates a destructive influence on the measurement. There is, however, a lack of description in the literature of the precise effect of the Goos-Haenchen phase on weak measurements. In this paper we address this issue, developing an analytic study for a Gaussian beam transmitted through a dielectric structure. We obtain analytic expressions for weak measurements as a function of the relative Goos-Haenchen phase and show how to remove it without the aid of waveplates.

arXiv comment12 pages, 4 figures

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Cited by in corpus (1)

• Lateral shifts and angular deviations of Gaussian optical beams reflected by and transmitted through dielectric blocks: A tutorial review