Fidelity based Measurement Induced Nonlocality over two-sided measurements
arXiv:1802.05660 · doi:10.1142/S0219749918500545
Abstract
In this paper, we introduce quantum fidelity based measurement induced nonlocality for the bipartite state over two-sided von Neumann projective measurements. While all the properties of this quantity are reflected from that of one-sided measurement, the latter one is shown to set an upper bound for arbitrary bipartite state. As an illustration, we have studied the nonlocality of Bell diagonal state.
11 pages comments are welcome
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