Dispersion measurement method with down conversion process

Abstract

Proper characterization of nonlinear crystals is essential for designing single photon sources. We show a technique for dispersion characterization of a nonlinear material by making use of phase matching in the process of parametric down conversion. Our method is demonstrated on an exemplary periodically poled potassium titanyl phosphate $KTiOP{O}_4$ crystal phase-matched for $396$ nm to $532$ nm and $1550$ nm. We show a procedure to characterize the dispersion in the range of $390$ to $1800$ nm by means of only one spectrometer for the UV-visible range.

References in corpus (2)

• Modelling and optimization of photon pair sources based on spontaneous parametric down-conversion
• Numerical Investigation of Photon-Pair Generation in Periodically Poled MTiOXO4 (M = K, Rb, Cs; X = P, As)

Cited by in corpus (3)

• A single photon detection system for visible and infrared spectrum range
• Optimizing the spectro-temporal properties of photon pairs from Bragg-reflection waveguides
• Degenerate Photons from a Cryogenic Spontaneous Parametric Down-Conversion Source