Multifrequency Excitation and Detection Scheme in Apertureless Scattering Near Field Scanning Optical Microscopy
arXiv:1706.03485 · doi:10.1364/OL.42.003157
Abstract
We theoretically and experimentally demonstrate a multifrequency excitation and detection scheme in apertureless near field optical microscopy, that exceeds current state of the art sensitivity and background suppression. By exciting the AFM tip at its two first flexural modes, and demodulating the detected signal at the harmonics of their sum, we extract a near field signal with a twofold improved sensitivity and deep sub-wavelength resolution, reaching . Furthermore, the method offers rich control over experimental degrees of freedom, expanding the parameter space for achieving complete optical background suppression. This approach breaks the ground for non-interferometric complete phase and amplitude retrieval of the near field signal, and is suitable for any multimodal excitation and higher harmonic demodulation.
arXiv comment5 pages, 4 figures
References in corpus (6)
- Imaging exciton-polariton transport in MoSe2 waveguides
- Electronic and plasmonic phenomena at graphene grain boundaries
- Hybrid tip-enhanced nano-spectroscopy and -imaging of monolayer WSe2 with local strain control
- Mechanical detection of carbon nanotube resonator vibrations
- Graphene-Based Platform for Infrared Near-Field Nanospectroscopy of Water and Biological Materials in an Aqueous Environment
- Nanofocusing of Hyperbolic Phonon-Polaritons in a Tapered Boron Nitride Slab