Monitoring ion track formation using in situ RBS/c and ERDA

Abstract

The aim of this work is to investigate feasibility of the ion beam analysis techniques for monitoring swift heavy ion track formation. First, use of the in situ Rutherford backscattering spectroscopy in channeling mode to observe damage build-up in quartz SiO2 after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO3, quartz SiO2, a-SiO2 and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO2, surface stoichiometry remained unchanged.

References in corpus (5)

• Online in-situ X-ray diffraction setup for structural modification studies during swift heavy ion irradiation
• On the threshold of ion track formation in CaF2
• Detecting swift heavy ion irradiation effects with graphene
• SHIPS: A new setup for the investigation of swift heavy ion induced particle emission and surface modifications
• SPORT: A new sub-nanosecond time-resolved instrument to study swift heavy ion-beam induced luminescence - Application to luminescence degradation of a fast plastic scintillator