paper

High precision half-life measurement of Sm decay from thin-film sources

arXiv:1703.07282 · doi:10.1103/PhysRevC.95.034618

Abstract

An investigation of the α-decay of Sm was performed using an ultra low-background Twin Frisch-Grid Ionisation Chamber (TF-GIC). Four natural samarium samples were produced using pulsed laser deposition in ultra high vacuum. The abundance of the Sm isotope was mea- sured using inductively coupled plasma mass spectrometry. A combined half-life value for 147Sm of years was measured. A search for the α-decay into the first excited state of Nd has been performed using -spectroscopy, resulting in a lower half-life limit of years (at 90% C.L.).

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