Rigorous Diffraction Interface Theory
arXiv:1612.07759 · doi:10.1063/1.4982208
Abstract
We present a new formalism for understanding the optical properties of metasurfaces, optically thin composite diffractive devices. The proposed technique, Rigorous Diffraction Interface Theory (R-DIT), provides an analytical framework for understanding the transition between optically thin and optically thick structures. For metasurfaces, R-DIT avoids the calculation of optical propagation through thin layer and provides a direct link between the composition and geometry of a metasurface and its transmission, reflection, and diffraction properties.
8 pages, 4 figures