Learning physical descriptors for materials science by compressed sensing
arXiv:1612.04285 · doi:10.1088/1367-2630/aa57bf
Abstract
The availability of big data in materials science offers new routes for analyzing materials properties and functions and achieving scientific understanding. Finding structure in these data that is not directly visible by standard tools and exploitation of the scientific information requires new and dedicated methodology based on approaches from statistical learning, compressed sensing, and other recent methods from applied mathematics, computer science, statistics, signal processing, and information science. In this paper, we explain and demonstrate a compressed-sensing based methodology for feature selection, specifically for discovering physical descriptors, i.e., physical parameters that describe the material and its properties of interest, and associated equations that explicitly and quantitatively describe those relevant properties. As showcase application and proof of concept, we describe how to build a physical model for the quantitative prediction of the crystal structure of binary compound semiconductors.
References in corpus (7)
- Kernel methods in machine learning
- Big Data of Materials Science - Critical Role of the Descriptor
- High-dimensional generalized linear models and the lasso
- Materials Cartography: Representing and Mining Material Space Using Structural and Electronic Fingerprints
- Compressive sensing as a new paradigm for model building
- Best subset selection, persistence in high-dimensional statistical learning and optimization under constraint
- Search for localized Wannier functions of topological band structures via compressed sensing