Determining the vibrations between sensor and sample in SQUID microscopy
arXiv:1610.00285 · doi:10.1063/1.4971201
Abstract
Vibrations can cause noise in scanning probe microscopies. Relative vibrations between the scanning sensor and the sample are important but can be more difficult to determine than absolute vibrations or vibrations relative to the laboratory. We measure the noise spectral density in a scanning SQUID microscope as a function of position near a localized source of magnetic field, and show that we can determine the spectra of all three components of the relative sensor-sample vibrations. This method is a powerful tool for diagnosing vibrational noise in scanning microscopies.
4 pages, 3 figures
References in corpus (6)
- Mechanical detection of carbon nanotube resonator vibrations
- Mechanics of Individual, Isolated Vortices in a Cuprate Superconductor
- Scanning SQUID susceptometers with sub-micron spatial resolution
- Probing dynamics and pinning of single vortices in superconductors at nanometer scales
- Mechanical control of individual superconducting vortices
- The response of small SQUID pickup loops to magnetic fields
Cited by in corpus (6)
- Cryogen-free variable temperature scanning SQUID microscope
- Scanning SQUID microscopy in a cryogen-free dilution refrigerator
- Versatile Millikelvin Hybrid Cooling Platform for Superconductivity Research
- Scanning SQUID-on-tip microscope in a top-loading cryogen-free dilution refrigerator
- Characterization of two fast-turnaround dry dilution refrigerators for scanning probe microscopy
- Isolation solution for extreme environmental vibrations for quantum-enabling cryogenic setups installed on raised frames