Bragg projection ptychography on niobium phase domain
arXiv:1608.03098 · doi:10.1103/PhysRevB.96.014109
Abstract
We demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg "dark field" imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analysed with the help of a careful combination of implemented refinement mechanisms.
Submitted on Aug, 8, 2016