Correspondence: Enhancing a phase measurement by sequentially probing a solid state system
arXiv:1604.06719 · doi:10.1038/ncomms11520
Abstract
In a recent paper, Liu et al. [Nat. Commun. 6:6726 (2015)] claim to perform the first room temperature entanglement-enhanced phase measurement in a solid-state system. We argue here that this claim is incorrect: their measurement is not enhanced because of the entanglement in their system, but instead the enhancement comes from the fact that the phase shift is applied twice to their state.
2 pages
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