Refocusing two qubit gates with measurements for trapped ions
arXiv:1604.05944 · doi:10.1103/PhysRevA.95.032314
Abstract
Dynamical decoupling techniques are the method of choice for increasing gate fidelities. While these methods have produced very impressive results in terms of decreasing local noise and increasing the fidelities of single qubit operations, dealing with the noise of two qubit gates has proven more challenging. The main obstacle is that the noise time scale is shorter than the two qubit gate itself so that refocusing methods do not work. We present a measurement and feedback based method to refocus two qubit gates which cannot be refocused by conventional methods. We analyze in detail this method for an error model which is relevant for trapped ions quantum information.
References in corpus (13)
- High-fidelity quantum logic gates using trapped-ion hyperfine qubits
- Optimized Dynamical Decoupling in a Model Quantum Memory
- High-fidelity preparation, gates, memory and readout of a trapped-ion quantum bit
- High-Fidelity Universal Gate Set for Be Ion Qubits
- Towards fault-tolerant quantum computing with trapped ions
- Dynamical Decoupling of a single electron spin at room temperature
- Arbitrarily accurate composite pulses
- Single Ion Quantum Lock-In Amplifier
- Robust optimal quantum gates for Josephson charge qubits
- A long-lived Zeeman trapped-ion qubit
- Quantum accuracy threshold for concatenated distance-3 codes
- Phase-modulated decoupling and error suppression in qubit-oscillator systems
- Refocusing two qubit gate noise for trapped ions by composite pulses