On a drift-diffusion system for semiconductor devices

Abstract

In this note we study a fractional Poisson-Nernst-Planck equation modeling a semiconductor device. We prove several decay estimates for the Lebesgue and Sobolev norms in one, two and three dimensions. We also provide the first term of the asymptotic expansion as $t\to \infty$.

arXiv commentto appear in Annales Henri Poincaré

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Cited by in corpus (3)

• The Optimal Temporal Decay Estimates for the Fractional Power Dissipative Equation in Negative Besov Spaces
• Suppression of blow up by a logistic source in $2$D Keller-Segel system with fractional dissipation
• Suppression of blow up by mixing in generalized Keller-Segel system with fractional dissipation