Certification of Boson Sampling Devices with Coarse-Grained Measurements

Abstract

A boson sampling device could efficiently sample from the output probability distribution of noninteracting bosons undergoing many-body interference. This problem is not only classically intractable, but its solution is also believed to be classically unverifiable. Hence, a major difficulty in experiment is to ensure a boson sampling device performs correctly. We present an experimental friendly scheme to extract useful and robust information from the quantum boson samplers based on coarse-grained measurements. The procedure can be applied to certify the equivalence of boson sampling devices while ruling out alternative fraudulent devices. We perform numerical simulations to demonstrate the feasibility of the method and consider the effects of realistic noise. Our approach is expected to be generally applicable to other many-body certification tasks beyond the boson sampling problem.

8 pages including Supplemental Materials, 7 figures, 3 tables

References in corpus (5)

• Photonic Boson Sampling in a Tunable Circuit
• Experimental Scattershot Boson Sampling
• Trapped ion quantum computation with transverse phonon modes
• Partial indistinguishability theory for multi-photon experiments in multiport devices
• Counting Statistics of Many-Particle Quantum Walks

Cited by in corpus (9)

• Quantum Approximate Optimization of the Long-Range Ising Model with a Trapped-Ion Quantum Simulator
• Sample complexity of device-independently certified "quantum supremacy"
• Experimental generalized quantum suppression law in Sylvester interferometers
• Witnessing genuine multi-photon indistinguishability
• Decision and function problems based on boson sampling
• Cryptographic One-way Function Based on Boson Sampling
• Distinguishing noisy boson sampling from classical simulations
• Efficient validation of Boson Sampling from binned photon-number distributions
• Sampling and the complexity of nature