The peculiarities of distributions of overfocused sputtered atoms ejected from (001) Ni with energy and angular resolution

Abstract

The features of the azimuthal-angle overfocusing of atoms sputtered from the surface of the Ni (001) face are studied by molecular dynamics computer simulation. The signal of overfocused atoms is found to be multi-valued with respect to the initial azimuthal angle due to different mechanisms of scattering. The overfocused atoms form separate maximum and can be detected in experiments with angle and energy resolution separately from the focused and the own atoms.

arXiv comment15 pages, 4 figures (in Russian). Presented at the 22nd International Conference on Ion-Surface Interactions (ISI-2015), Moscow, Russia, 20-24 August 2015