Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level

Abstract

We present the characterisation of three Cryogenic Sapphire Oscillators using the three-corner-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyse the frequency stability limitations of these state-of-the-art ultra-stable oscillators. The best unit presents a fractional frequency stability better than 5e-16 at 1 s and below 2e-16 for integration times less than 5,000s.

arXiv comment7 pages, 8 figures

References in corpus (2)

• On the measurement of frequency and of its sample variance with high-resolution counters
• Adapting a Cryogenic Sapphire Oscillator for Very Long Baseline Interferometry