Atom beam triangulation of organic layers at 100 meV normal energy: self-assembled perylene on Ag(110) at room temperature
arXiv:1509.05549 · doi:10.1016/j.apsusc.2015.12.134
Abstract
The controlled growth of organic layer on surface is still awaiting for an on-line reliable monitoring that would allow improvement of its quality. We show here that the self-assembly of the perylene monolayer deposited on Ag(110) at room temperature can be tracked with low energy atoms in a regime where the energy perpendicular to the layer is less than 0.1 eV preventing damage to the layer. The image processing required for this triangulation technique with atoms is described in details.
References in corpus (1)
Cited by in corpus (6)
- Elastic and inelastic diffraction of fast atoms,\linebreak Debye-Waller factor and Mössbauer-Lamb-Dicke regime
- A large area high resolution imaging detector for fast atom diffraction
- Active correction of the tilt angle of the surface plane with respect to the rotation axis during azimuthal scan
- Temperature dependence in fast-atom diffraction at surfaces
- Energy loss and inelastic diffraction of fast atoms at grazing incidence
- A setup for grazing incidence fast atom diffraction