Application of bond valence method in the non-isovalent semiconductor alloy (GaN)(ZnO)
arXiv:1509.04678 · doi:10.1088/0965-0393/24/7/075014
Abstract
This paper studies the bond valence method (BVM) and its application in the non-isovalent semiconductor alloy (GaN)(ZnO). Particular attention is paid to the role of short-range order (SRO). A physical interpretation based on atomic orbital interaction is proposed and examined by density-functional theory (DFT) calculations. Combining BVM with Monte-Carlo simulations and a DFT-based cluster expansion model, bond-length distributions and bond-angle variations are predicted. The correlation between bond valence and bond stiffness is also revealed. Finally the concept of bond valence is extended into the modelling of an atomistic potential.