Universal features of phonon transport in nanowires with correlated surface roughness
arXiv:1506.02350 · doi:10.1063/1.4916962
Abstract
The ultralow thermal conductivity observed experimentally in intentionally roughened silicon nanowires (SiNWs) is reproduced in phonon Monte Carlo simulations with exponentially correlated real-space rough surfaces similar to measurement [J. Lim, K. Hippalgaonkar, S. C. Andrews, A. Majumdar, and P. Yang, Nano Lett. 12, 2475 (2012)]. Universal features of thermal transport are revealed by presenting as a function of the normalized geometric mean free path (); the diffusive (Casimir) limit corresponds to . vs is exponential at low-to-moderate roughness (high ), where internal scattering randomly interrupts phonon bouncing across the SiNW, and linear at high roughness (low ), where multiple scattering events at the same surface results in ultralow, amorphous-limit thermal conductivity.
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Cited by in corpus (4)
- Non-diffusive Lattice Thermal Transport in Si-Ge Alloy Nanowires
- Enhanced Phonon Boundary Scattering at High Temperatures in Hierarchically Disordered Nanostructures
- Computationally efficient Monte Carlo electron transport algorithm for nanostructured thermoelectric material configurations
- Effect of wave versus particle phonon nature in thermal transport through nanostructures