Far field imaging of a dielectric inclusion
arXiv:1504.02869 · doi:10.1088/1742-6596/657/1/012001
Abstract
A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.
6 pages, 5th International Workshop on New Computational Methods for Inverse Problems, ENS Cachan, France