Growth-induced electron mobility enhancement at the LaAlO/SrTiO interface
arXiv:1503.05906 · doi:10.1063/1.4907676
Abstract
We have studied the electronic properties of the 2D electron liquid present at the LaAlO/SrTiO interface in series of samples prepared at different growth temperatures. We observe that interfaces fabricated at 650°C exhibit the highest low temperature mobility () and the lowest sheet carrier density (). These samples show metallic behavior and Shubnikov-de Haas oscillations in their magnetoresistance. Samples grown at higher temperatures (800-900°C) display carrier densities in the range of and mobilities of at 4K. Reducing their carrier density by field effect to lowers their mobilites to bringing the conductance to the weak-localization regime.
References in corpus (4)
- Electric Field Control of the LaAlO/SrTiO Interface Ground State
- Surface defects and conduction in polar oxide heterostructures
- Large modulation of the Shubnikov-de Haas oscillations by the Rashba interaction at the LaAlO/SrTiO interface
- Optically excited multi-band conduction in LaAlO3/SrTiO3 heterostructures