paper

Growth-induced electron mobility enhancement at the LaAlO/SrTiO interface

arXiv:1503.05906 · doi:10.1063/1.4907676

Abstract

We have studied the electronic properties of the 2D electron liquid present at the LaAlO/SrTiO interface in series of samples prepared at different growth temperatures. We observe that interfaces fabricated at 650°C exhibit the highest low temperature mobility () and the lowest sheet carrier density (). These samples show metallic behavior and Shubnikov-de Haas oscillations in their magnetoresistance. Samples grown at higher temperatures (800-900°C) display carrier densities in the range of and mobilities of at 4K. Reducing their carrier density by field effect to lowers their mobilites to bringing the conductance to the weak-localization regime.

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