Main Magnetic Focus Ion Source: I. Basic principles and theoretical predictions

Abstract

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, the extremely high electron current densities can be attained on short length of the ion trap. The design the very compact ion sources is feasible. For such ions as, for example, Ne${}^{8+}$ and Xe${}^{44+}$, the intensities of about $10^9$ and $10^6$ particles per second, respectively, can be obtained.

16 pages, 10 figures

References in corpus (1)

• Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions