Electric-field induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111)
arXiv:1502.07519 · doi:10.1103/PhysRevB.91.184107
Abstract
We present a detailed study of an electric-field induced phase transition of a single layer of Fe on a Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and to follow the transition from face-centered cubic to hexagonal closepacked stacking with atomic resolution.
5 figures