The tearing mode instability of thin current sheets: the transition to fast reconnection in the presence of viscosity
arXiv:1412.0047 · doi:10.1088/0004-637X/801/2/145
Abstract
This paper studies the growth rate of reconnection instabilities in thin current sheets in the presence of both resistivity and viscosity. In a previous paper, Pucci and Velli (2014), it was argued that at sufficiently high Lundquist number S it is impossible to form current sheets with aspect ratios L/a which scale as with because the growth rate of the tearing mode would then diverge in the ideal limit . Here we extend their analysis to include the effects of viscosity, (always present in numerical simulations along with resistivity) and which may play a role in the solar corona and other astrophysical environments. A finite Prandtl number allows current sheets to reach larger aspect ratios before becoming rapidly unstable in pile-up type regimes. Scalings with Lundquist and Prandtl numbers are discussed as well as the transition to kinetic reconnection
Accepted for publication in The Astrophysical Journal on January 16, 2015
References in corpus (2)
Cited by in corpus (7)
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